Parole chiave di "Ion Implanted p+/n 4H-SiC Junctions: effect of the Heating Rate during Post Implantation Annealing"
- Label
- Parole chiave di "Ion Implanted p+/n 4H-SiC Junctions: effect of the Heating Rate during Post Implantation Annealing" (literal)
- Keywords of "Ion Implanted p+/n 4H-SiC Junctions: effect of the Heating Rate during Post Implantation Annealing" (literal)
- Insieme di parole chiave di
- Ion Implanted p+/n 4H-SiC Junctions: effect of the Heating Rate during Post Implantation Annealing (Contributo in atti di convegno) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1301)
- Ha membro
- 4H-SiC (Parola chiave)
- post imèlantation annealing (Parola chiave)
- electronic device processing (Parola chiave)
- wide band gap semiconductors (Parola chiave)
Incoming links:
- Insieme di parole chiave
- Ion Implanted p+/n 4H-SiC Junctions: effect of the Heating Rate during Post Implantation Annealing (Contributo in atti di convegno) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1301)
- Membro di
- 4H-SiC (Parola chiave)
- post imèlantation annealing (Parola chiave)
- wide band gap semiconductors (Parola chiave)
- electronic device processing (Parola chiave)