Black gloss characterization of Greek Attic pottery carried out by means of the new non-destructive PIXE-alpha portable system (Rapporti tecnici/preprint/working paper)

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Label
  • Black gloss characterization of Greek Attic pottery carried out by means of the new non-destructive PIXE-alpha portable system (Rapporti tecnici/preprint/working paper) (literal)
Anno
  • 2000-01-01T00:00:00+01:00 (literal)
Alternative label
  • Pappalardo Lighea, Romano Francesco Paolo, De Sanoit Jaques (2000)
    Black gloss characterization of Greek Attic pottery carried out by means of the new non-destructive PIXE-alpha portable system
    (literal)
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  • Pappalardo Lighea, Romano Francesco Paolo, De Sanoit Jaques (literal)
Pagina inizio
  • 171 (literal)
Pagina fine
  • 173 (literal)
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  • 2000 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 4 (literal)
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  • a) INFN Laboratori Nazionali del Sud, LANDIS, Catania, Italy b) University of Catania, Ct-Le MURST E.U. Project, Catania, Italy c) CEA\ DAMRI\Laboratoire Primaire des Rayonnements Ionisants, Saclay, France (literal)
Titolo
  • Black gloss characterization of Greek Attic pottery carried out by means of the new non-destructive PIXE-alpha portable system (literal)
Abstract
  • In the present work we demonstrate that the new portable system PIXE - ALPHA recently designed and realised through a collaboration between the DAMRI-SACLAY (France) and the LNS laboratory (Italy) gives the possibility of a non destructive and careful analysis of pigments and it is particularly suited in the characterization of the black gloss present in Attic pottery. This because PIXE analysis is sensitive to light elements and concerns only the surface layers; as it is known the major elements present in the black gloss range from Na to Fe. (literal)
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