http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35668
Defects in nanocrystalline SnO2 studied by Tight Binding (Articolo in rivista)
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- Label
- Defects in nanocrystalline SnO2 studied by Tight Binding (Articolo in rivista) (literal)
- Anno
- 2004-01-01T00:00:00+01:00 (literal)
- Alternative label
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Mazzone AM, Morandi V (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- CNR, IMM, I-40129 Bologna, Italy (literal)
- Titolo
- Defects in nanocrystalline SnO2 studied by Tight Binding (literal)
- Abstract
- In this work we present a study of the properties of defective nanostructures. The material chosen to this purpose, i.e. SnO2, has practical applications and many of them rely on the spontaneous formation of vacancies. Therefore, crystalline grains with shape, and size comparable to the experimental ones have been considered. According to the bulk properties, the grains lattice has the rutile structure and may also include vacancy defects. The calculations describe the effects of the structural grain parameters, i.e. size and shape, as well as of the defect type, on the grain cohesion and are based on a Tight Binding method. The comparison with Density Functional calculations, also carried out in the course of this study. illustrates the limits of both methods when used for these complex structures. (literal)
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