Applied physics express
- Label
- Applied physics express (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
- Ab initio study of Ge intercalation in epitaxial graphene on SiC(0001) (Articolo in rivista) (Prodotto della ricerca)
- Microwave Annealing of Very High Dose Aluminum-Implanted 4H-SiC (Articolo in rivista) (Prodotto della ricerca)
- Effects of Thermal Treatments on the Trapping Properties of HfO2 Films for Charge Trap Memories (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Alternative label
- Applied physics express. (literal)
- APEX (literal)
- Appl. phys. express (literal)
- Language
- eng (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#issn
- 1882-0786 (literal)
- Preferred label
- Applied physics express (literal)
- Publisher
- Japan Society of Applied Physics [Tokyo] : JPN (literal)
Incoming links:
- Rivista
- Effects of Thermal Treatments on the Trapping Properties of HfO2 Films for Charge Trap Memories (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Microwave Annealing of Very High Dose Aluminum-Implanted 4H-SiC (Articolo in rivista) (Prodotto della ricerca)
- Ab initio study of Ge intercalation in epitaxial graphene on SiC(0001) (Articolo in rivista) (Prodotto della ricerca)